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TMS570LC4357: RAM, EEPROM corruption validation

Part Number: TMS570LC4357


1) What are the corruption validation methods for RAM, EEPROM and FLASH?

2) How can I check the RAM, EEPROM and FLASH every 20 seconds for validation?

3) What are the modules involved for this check?

4) Which sections in the TRM should I refer to get an idea on above points?

  • Hello Aswin,

    4. Please read the chapter 7/8/9 of device TRM

    1. At startup time, PBIST test can check the integrity of the entirety of RAM. The flash ECC self test diagnostics can check if the CPU ECC logic and ECC compare logic work as expected. During application run time, the SECDED takes over as the active diagnostic and prevents/notifies of any issues with RAM/Flash. 

    2. The ECC logic for RAM and Flash are performing the diagnostic continuously.

    3. RAM, Flash, ESM