Part Number: TMS570LC4357
Hi Team,
For our application based on TMS570LC4357 processor, As per our requirement we are trying to perform the destructive test(without using PBIST) for the complete Internal 512KB RAM and configure the test result in the internal EEPROM. As per our implementation, we tried to perform the internal RAM test just after initializing the RAM and in that case the build is running properly, but as this test is performed before PLL, we are not able to log the result in the EEPROM as PLL is not setup and internal Flash is not initialized; However, when we tried to perform the internal RAM test after PLL where Flash is also initialized, we are seeing that the STC self test is not performing the system reset and consequently the build does not come up.
Here, To accomplish this we would like to understand the better approach to perform this test:
1. Firstly, where exactly we have to run this test on internal RAM with respect to PLL. Are we supposed to run this before setting up the PLL or after configuring it?
2. Is there any relation between the STC self test which is not allowed to reset when the RAM test is performed after PLL?
3. What could be the better approach to log the test results in EEPROM, if we are expected to perform the RAM test before PLL?
Request to help us in understanding this better, to accomplish this requirement.
Regards,
Shivam