TMDSHSECDOCK: Error -2131 @ 0x0

Hi Renan,

Yes that is likely a hardware issue if they are still able to connect to their other control cards normally. If that is the case, I will likely not be able to provide a way to fix the issue, but we could maybe still diagnose the problem. 

If the customer is still interested in debugging anyways, I would be curious to see what happens when you use Code Composer Studio to open the Target Configuration for the CCS Project, then use the 'Test Connection' option. This tests the JTAG connection to your device, and its output log may give some clues about what is going wrong. Please post the output log from 'Test Connection'. 

If the customer is able to look at your signals with an oscilloscope, they should see the same patterns as I do when I 'Test Connection', with small variability due to the specific debugger. The image below shows TDO (yellow), TMS (purple), TCK (blue), and TRST (green). This is the start of the 'Test Connection' sequence that I captured as a single sequence, triggered on the falling edge of TMS. All signals are 3.3V digital signals.

If you zoom in more closely, you should see this same pattern at the start. 

I would be curious to learn if the customer sees something different. Depending on the type of hardware issue, I would expect TDO to not look the same as my oscilloscope screenshots.

Best Regards,

Ben Collier

Hi Benjamin,

Here is the output log from "Test Connection":

[Start: Texas Instruments XDS100v2 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

-----[Print the board config pathname(s)]------------------------------------

/Users/claudio/.ti/ccs1120/0/0/BrdDat/testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'libjioserdesusb.dylib'.
The library build date was 'Mar 17 2022'.
The library build time was '14:27:39'.
The library package version is '9.7.0.00213'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v2 USB Debug Probe_0]

Hi Claudio,

This error message means that there is something wrong with the JTAG scan path, and the device is not circulating bits at all. Since Renan said that this issue is occurring on a control card, it is not a problem with the traces or signal quality. Somehow, the boundary scan registers on the F2837x device itself are malfunctioning. We could probably learn more about what is going wrong if you probe your signals with an oscilloscope like I outlined in my last response. Unfortunately, I think it is unlikely that we will be able to find a solution that doesn't involve replacing hardware. 

Best Regards,

Ben Collier

Hello Ben,

Good day and thank you for this response. Please see update from Claudio below:

I was able to post in the forum the output log from "Test Connection", but now I am unable to post the scope screenshots that I got. I'm sending them to you then, so you can post them there to me, please.
They all show the TMS signal along with either TCK, TDO or TRST, as specified in the name of the file.

1460.image.zip

Regards,

Renan

Hi Renan,

It looks like there is no TDO signal coming from the target device, so there is some hardware damage to the device affecting the JTAG functionality. Unfortunately, I think you will have to replace the device. 

Best Regards,

Ben Collier