Hi,
We are using TMDSEMU110-U for debugging AM3357. It worked without problems when debugging AM3357 at 300MHz. However, after increasing the frequency of AM3357 to 600MHz, the connection of TMDSEMU110-U became unstable and the firmware could not be loaded. There is a possibility that this is due to the effect of increasing the frequency, but could you give me any comments?
Thanks,
Conor
Hi ki,
Thank you for your reply.
Also please run a JTAG connectivity test for when the device is configured for the higher clock rate, and post the results
I have attached the execution results. Below is the CCS capture when the error occurs.
AMIC110_DBG_CnctTestMess2.txt is the connection test result at that time.
[Start: Texas Instruments XDS110 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\NSW00_~1.NSW\AppData\Local\TEXASI~1\
CCS\ccs930\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Nov 25 2019'.
The library build time was '16:55:29'.
The library package version is '8.4.0.00006'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
An error occurred while hard opening the controller.
-----[An error has occurred and this utility has aborted]--------------------
This error is generated by TI's USCIF driver or utilities.
The value is '-260' (0xfffffefc).
The title is 'SC_ERR_XDS110_OPEN'.
The explanation is:
An attempt to connect to the XDS110 failed.
The cause may be one or more of: no XDS110 is connected, invalid
firmware update, invalid XDS110 serial number, or faulty USB
cable. The firmware and serial number may be updated using the
xdsdfu utility found in the .../ccs_base/common/uscif/xds110
directory of your installation. View the ReadMe.txt file there
for instructions.
[End: Texas Instruments XDS110 USB Debug Probe_0]
AMIC110_DBG_CnctTestMess.txt is the result of running a connect test before CCS TargetConfiguration. There seems to be no error at this time.
[Start: Texas Instruments XDS110 USB Debug Probe_0]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\NSW00_~1.NSW\AppData\Local\TEXASI~1\
CCS\ccs930\0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Nov 25 2019'.
The library build time was '16:55:29'.
The library package version is '8.4.0.00006'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG IR Integrity scan-test has succeeded.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.
The JTAG DR Integrity scan-test has succeeded.
[End: Texas Instruments XDS110 USB Debug Probe_0]
Thanks,
Conor