TMS470MF03107: S4MF03107SPZQQ1R

Hi,

Chen jialing said:

Your team rejected my CPR and request me to have a discussion with TI FAE first. So i contact E2E for support.

Have you received any report from TI on this return? If yes, who was the person who contacted you? The link you provided is not accessible. 

Hi Charles,

TI reject to perform FA on this case, so i didn't receive any report from TI. It's replied by your system, i don't know the person exactly.

I attached the e-mail for your reference.

. Texas Instruments requires additional information about CPR No CPR241113226.msg

Hi Jialing,

  Did you receive the unit back? Your attached message has the below comments that additional information is needed from the customer. I need to find out who is the quality FAE that handles your case. 

Please ask TI FAE to check for the reported programming fail details and comment from technical side, upload the email with FAE for reference. when you found the can't program have you checked any pin voltage or any pin resistance anomaly comparing with good board/good unit? I don't know who is your FAE or if your company has dedicated TI FAE, you can check with your buyer to check for it, if no dedicated FAE, you can find TI E2E for technical support.

Hi Charles,

Sorry for the late reply.

No find any abnormal with voltage and impedance compared with reference board and unit.

I haven't send out the unit to TI because your team rejected my CPR fa request. Now the component is on my hand and i need TI to support FA on this unit.

I don't know the quality FAE who is because the reply is send by TI system, and it didn't show the contact way of quality person.

I alreay explained in CPR again yesterday,but they still not accept the FA request. 

They provide the contact window. Frank Hou, junfeng-hou@ti.com 

Could you help to check with Frank what on earth they need? Thank u!

Hi Jialing,

  I can check with this engineer. Did he provide a reason?

Hi,

  Did the chip fail program/erase on the first try? In another word, did you have any success with program/erase before it started to show error?

  Can you show the error when programming failed?

  Which debug probe do you use? Do you have another debug probe you can try that can replicate the error?

  Can you run a JTAG scan-chain test? Below is an example using XDS200 debug probe to run a scan test. What is your scan test result? First run on a known good board to have a reference for comparison then try on your suspected board. 

[Start: Texas Instruments XDS2xx USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\a0321879\AppData\Local\TEXASI~1\
    CCS\ccs1011\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'May  7 2020'.
The library build time was '20:23:44'.
The library package version is '9.2.0.00002'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

This emulator does not create a reset log-file.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS2xx USB Debug Probe_0]