TMS570LS1224: Consideration of ISO 26262-5:2018 Requirements 9.4.1.2 and 9.4.1.3 in MCU FMEDA

Hi Lukas,

I am not fully expert with FMEDA document,

However, when i verify the FMEDA document Total Single point faults and Total residual fault information in the document. And also, for every memory, for every peripheral and for memory etc. also considered both residual and single point faults. For more details refer FMEDA document once. Let me know if you have any further questions, i will check with expert.

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Thanks & regards,
Jagadish.

I'm sorry, this does not help me.

The ISO 26262-5 requirements i posted above specify, that not one single point fault or residual fault (of each of the failure modes) is allowed to exceed one-tenth of the value corresponding to failure rate class 2, which results in 0,1 FIT for ASIL C (i forgot to mention the ASIL in the post above).

The published part of the Excel FMEDA for the MCU does not show the individual failure modes and their quantitative evaluation (failure rate specific to failure mode or failure mode distribution, evaluation for SPF and LF, Safety Mechanisms and diagnostic coverage as well as the resulting single point / residual fault rates). Therefore i cannot check, whether the above stated requirement was fullfilled.

Regardless of the problem above, the question remains, whether these are relevant requirements for semiconductor components in the context of ISO 26262.

Thank you for your help.

Kind regards,

Lukas

Hi, jagadish, could you forward this to an Expert for the FMEDA document?

Thank you!