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TMS570LC4357-SEP: Screening and qual. for TMS570LC4357-SEP

gino filippi
Prodigy 35 points
Part Number: TMS570LC4357-SEP

Tool/software:

HI Folks, 

Lockheed is looking to use this microcontroller for their LM400 satellite program, we're looking for the screening and qualification tests that are performed on this part.  Looks like no burn-in is performed, outgassing is, temp cycling and HAST at the lot level but I don't see much else.

Please let me know, we're looking to meet EEE-INST-002, Level 3 requirements or justify why being short of the requirements is ok.

Thanks, 

Gino Filippi 

  • 0
    TI__Guru* 80250 points

    Gino,

    The SEP requirements you have listed are in addition to those added for -EP classification which are in addition to our normal testing and reliability monitors. 

    We would need to verify this, but since TMS570 device was automotive device which follows the AECQ100 flow I would suspect that the -SEP variant is also following this flow/standard.

    It looks like we need to get some info on what is TI standard manufacturing flow in terms of testing/reliability/qual so that we can communicate the full suite of requirements of -SEP to the customer.

    Do you have experience with other -SEP devices from TI and how they are communicating this?

    Best,

    Matthew