TMDSEMU110-U: defect

Hi,

What failure code are you seeing in CCS? This application note can help debug further: https://www.ti.com/lit/an/spracf0/spracf0.pdf

Best,

Matt

You can find below the failure message from CCS - the fault code is -233. 

We checked the suggestions indicated by the application note for the fault code -233 but our PCB design for the MCU board and the cable harness are correct since another XDS110 probe work correctly. So please suggest a SW fix for the probe otherwise it is clearly a HW fault on the XDS110 probe for which we are asking for a replacement as this is affecting our project.

thanks

Francesco Paparella

[Start: Texas Instruments XDS110 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]

-----[Print the board config pathname(s)]------------------------------------

C:\Users\FPAPAR~1\AppData\Local\TEXASI~1\
CCS\ccs1220\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100/110/510 class product.
This utility will load the adapter 'jioxds110.dll'.
The library build date was 'Nov 28 2022'.
The library build time was '16:30:46'.
The library package version is '9.10.0.00080'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '5' (0x00000005).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the XDS110 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for XDS110 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[An error has occurred and this utility has aborted]--------------------

This error is generated by TI's USCIF driver or utilities.

The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.

The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.

[End: Texas Instruments XDS110 USB Debug Probe_0]

Hello,

What is the status of the probe's LEDs?

Source: https://www.ti.com/lit/ug/sprui94/sprui94.pdf

Can you also try manually updating the probe's firmware? Please refer to this guide for steps: https://software-dl.ti.com/ccs/esd/documents/xdsdebugprobes/emu_xds110.html#updating-the-firmware

Best,

Matt