TMS570LS0914: Reliability of Flash Bank 7

Part Number: TMS570LS0914
Other Parts Discussed in Thread: HALCOGEN

Tool/software:

Hi Team,

I am currently working on a safety-critical embedded application using the TMS570 microcontroller, where we utilize Flash Bank 7 for internal EEPROM emulation via the F021 Flash API. As this region is used to store critical runtime data, we seek clarification on its reliability and long-term performance characteristics.

1. what is the maximum number of read/write cycles supported by bank 7?

2. Are there any risks for memory corruption in bank 7?

3. What is maximum data retention time for bank 7?

4. Is it okey if I disabled the ECC during read / write?

5. What is the best practice to handle the Bank 7?

6. Are there any diagnostics APIs to check Flash bank 7 health?

I appreciate your support and look forward to your recommendations

Thanks,

Subhash

  • Hi Subhash,

    1. what is the maximum number of read/write cycles supported by bank 7?

    100K write/erase cycles. please refer to the device datasheet

    2. Are there any risks for memory corruption in bank 7?

    The memory is protected by ECC: one bit error detected and corrected, and two-bit error detected.

    3. What is maximum data retention time for bank 7?

    4. Is it okey if I disabled the ECC during read / write?

    Enabling flash ECC is recommended in functional safety application. ECC can be disabled and enabled manually by calling APIs generated by HalCoGen.

    5. What is the best practice to handle the Bank 7?

    The flash bank 7 is data flash. It should not be used for code. It can be used as EEPROM using the FEE driver generated by HalCOGen.

    6. Are there any diagnostics APIs to check Flash bank 7 health?

    Yes, you can flash selftest API to manually inject ECC errors.