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TMDSEMU110-U: Debug Probe Error -1170 with AM2432

Marvn Arcangel
Genius 16670 points

Part Number: TMDSEMU110-U
Other Parts Discussed in Thread: AM2432

Hi Team,

A customer is experiencing a recurring "Error -1170" when attempting to debug an AM2432_ALX device using an XDS110 debug probe in Code Composer Studio. The error message indicates an inability to access the Debug Access Port (DAP) and suggests resetting the device or checking connections/settings. 
Crucially, the customer notes that new XDS110 probes work initially but fail after about a day of use, developing into this persistent error state. They have already attempted common troubleshooting steps including resetting probe firmware, reducing clock speed, and checking pin connections, but the issue persists across multiple probes.

I suggested to follow the troubleshooting solution from the link below

https://software-dl.ti.com/ccs/esd/documents/ccs_debugging_jtag_connectivity_issues.html#cannot-access-the-dap

However, nothing works and the issue still persist. Please see the troubleshooting attempt and the result below for more details.

Attempt 1 – Use different computers to determine if the problem is local

Windows 11, CCS 12? : Same error message
Windows 11, CCS 20.3.1: Same error message
Windows 11, CCS 20.3.1, 12?: Same error message
Virtual Machine - Linux (Ubuntu 2204), CCS 20.3.1: Same error message

Attempt 2 – Reflash xds110 Debug probe firmware

# xds110 Utilities directory
cd C:\ti\ccs2031\ccs\ccs_base\common\uscif\xds110
# Switch the device into DFU mode.
xdsdfu -m
# Firmware_3.0.0.8.bin to the device, and then resets
xdsdfu -f firmware_3.0.0.8.bin -r
Same error still persistent

Attempt 3 – Lower the JTAG TCLK Frequency to 100Hz

Lowered the JTAG TCLK Frequency to 100Hz on the 'Texas Instruments XDS100 USB Debug Probe' Connection on the advanced tab of the .ccxml file.

It appears that new xds110 probes can access the card (AM24 chip) without encountering this error. However, upon returning to a new xds110 debug probe that was working as expected prior to, was found to have the same error as the other probes. This error has also been observed on the TI Launchpad kit with the Sitara AM243x MCU using the embedded xds110 debug probe. (Note that I have not seen this specific embedded probe successfully connect before.) 

Can you help further?

Regards,

Marvin

  • 0
    TI__Guru 64655 points

    This sounds like something in the test environment is being exposed to an EOS (Electrical Over-Stress) event.

    It is not clear if the customer is connecting the debugger to a TI EVM or a custom system design. Can you please provide details on everything connected to the board being tested, including power sources, network connections, other PCB assemblies, PC/laptop via USB or UART, and provide details how any of the attached devices are connect to the AC power mains.

    Was anything hot-plugged or hot-unplugged between the time the system was working as expected until it stopped working? Hot plugging barrel power plugs can create late-ground connectivity, which can create EOS events when the entire PCB assembly rises to the potential of the positive power supply potential when the positive terminal connects before ground. You should never hot-plug a barrel power plug for this reason.

    Is the test being performed at an ESD workstation with the user wearing the appropriate ESD protection gear?

    Regards,
    Paul