TMDSEMU200-U: XDS200 Debug Probe – SC_ERR_PATH_BROKEN during Test Connection

Hello TI Support Team,

I am experiencing an issue with an XDS200 USB Debug Probe that fails during Test Connection in Code Composer Studio.

Setup

• Debug Probe: Texas Instruments XDS200 USB Debug Probe

• Host OS: Windows 10 (64-bit)

• Code Composer Studio: CCS 12.8.1

• USCIF package version: 20.0.0.3178

• Target: Custom board (JTAG connection verified on hardware side)

Problem Description

When I run Test Connection from the CCS Target Configuration window, the test fails with the error SC_ERR_PATH_BROKEN (-233). The probe is detected correctly by the system and resets successfully, but fails during the JTAG scan-path integrity check.


```[Start: Texas Instruments XDS2xx USB Debug Probe_0] Execute the command: %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity [Result] -----[Print the board config pathname(s)]------------------------------------ C:\Users\tckatis\AppData\Local\TEXASI~1\ CCS\ccs1281\0\1\BrdDat\testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 560/2xx-class product. This utility will load the program 'xds2xxu.out'. The library build date was 'Sep 26 2024'. The library build time was '14:57:19'. The library package version is '20.0.0.3178'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '13' (0x0000000d). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- This emulator does not create a reset log-file. -----[An error has occurred and this utility has aborted]-------------------- This error is generated by TI's USCIF driver or utilities. The value is '-233' (0xffffff17). The title is 'SC_ERR_PATH_BROKEN'. The explanation is: The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. [End: Texas Instruments XDS2xx USB Debug Probe_0] ```

Additional Notes

• The probe enumerates correctly over USB and is detected by CCS.

• The failure occurs consistently during the scan-path integrity check.

• I would like to confirm whether this error could be related to:

  • A known XDS200 firmware/driver issue

  • Probe hardware fault

  • Any additional diagnostic steps recommended to isolate probe vs target issues

Please let me know if additional logs, CCS diagnostic outputs, or probe firmware details are required.

Thank you for your support.

Best regards,
Themis