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TMDSEMU200-U: Issue with debug probes

Yaroslav Mudritsky
Prodigy 140 points

Part Number: TMDSEMU200-U
Other Parts Discussed in Thread: TMDSEMU110-U

We are experiencing serious reliability issues with the TMDSEMU200-U debug probes.

We currently own 4 units, and all 4 of them have progressively degraded during approximately two years of normal use, to the point where they are now almost unusable.

The main issues are:

  • The LED does not turn on when the probe is connected via USB.
  • Code Composer Studio does not recognize the probe correctly.
  • We have to disconnect and reconnect the probe many times before it is detected.
  • The problem occurs both with and without the MCU connected.

The behavior is consistent across all four units, which suggests a possible hardware reliability issue or component degradation over time.

In this cases, the “Test Connection” utility completely fails with the following error:

[Start: Texas Instruments XDS2xx USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]

-----[Print the board config pathname(s)]------------------------------------

C:\Users\MUDRIT~1.BAL\AppData\Local\TEXASI~1\
    CCS\ccs1230\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
E_RPCENV_IO_ERROR(-6) No connection: DTC_IO_Open::dtc_io
Failed to open i/o connection (xds2xxu:0)

An error occurred while soft opening the controller.

-----[An error has occurred and this utility has aborted]--------------------

This error is generated by TI's USCIF driver or utilities.

The value is '-250' (0xffffff06).
The title is 'SC_ERR_ECOM_EMUNAME'.

The explanation is:
An attempt to access the debug probe via USCIF ECOM has failed.

[End: Texas Instruments XDS2xx USB Debug Probe_0]

In other cases, after multiple reconnection attempts, the probe is eventually detected and the integrity scan passes successfully, as shown below:

[Start: Texas Instruments XDS2xx USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

[Result]

-----[Print the board config pathname(s)]------------------------------------

C:\Users\MUDRIT~1.BAL\AppData\Local\TEXASI~1\
    CCS\ccs1230\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 560/2xx-class product.
This utility will load the program 'xds2xxu.out'.
The library build date was 'Mar 10 2023'.
The library build time was '22:17:39'.
The library package version is '9.11.0.00128'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '13' (0x0000000d).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

This emulator does not create a reset log-file.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS2xx USB Debug Probe_0]

Could you please advise whether this is a known issue and if there are any recommended troubleshooting steps, repair options, or replacement procedures? Changing PC (tried on 5/6 Windows 11) doesn't solve.

  • 0
    TI__Mastermind 31163 points

    Thank you for the detailed report, Yaroslav.

    Based on your description, this does appear to be a hardware degradation issue affecting all four of your TMDSEMU200-U units. The fact that all units exhibit the same progressive failure pattern over approximately two years suggests component wear rather than a software or configuration issue.

    Before pursuing replacement, please attempt the following:

    1. USB Connection Testing

      • Try different USB 2.0 certified cables
      • Test with USB 2.0 ports specifically (avoid USB 3.0 if possible)
      • Try a powered USB hub with external power supply
      • Check for physical damage or loose connections on the probe's USB connector

    2. Driver and Firmware Updates

      • Reinstall XDS emulation drivers: Help → Check for Updates → Emulation Updates in CCS
      • Update emulator firmware: Help → Check for Updates → XDS Emulation Firmware Updates
      • Verify the probe appears correctly in Windows Device Manager

    3. Physical Inspection

      • Check for visible component damage or bulging capacitors
      • Verify the probe doesn't overheat during operation

    Root Cause Analysis

    The SC_ERR_ECOM_EMUNAME error with E_RPCENV_IO_ERROR(-6) indicates the USCIF driver cannot establish communication with the emulator controller. Combined with the LED not illuminating and the consistent failure across all four units, this points to hardware-level power delivery or USB enumeration failures, this could possibly be due to component aging.

    Given that:

    • All 4 units show identical symptoms
    • The issue persists across multiple PCs (5-6 Windows 11 systems tested)
    • The units have been in service for approximately 2 years
    • Basic troubleshooting hasn't resolved the issue

    Hardware replacement is likely necessary. Consider upgrading to the XDS110 (TMDSEMU110-U) as a more reliable alternative, or replacing with current TMDSEMU200-U units if your workflow specifically requires XDS200-class emulators.

    Please contact TI through your normal purchasing channel to discuss replacement options, potential RMA for the defective units, and any applicable warranty coverage.

    Let me know if you need any additional information or if the troubleshooting steps reveal anything new.

    Best Regards,

    Zackary Fleenor