Is it possible to provide any evidence of radiated emissions (TEM cell) test on TMS570?
Our radiated emissions (TEM cell) test failed on TMS570LS2124(QFP) under following condition.
-emission frequency: 480 [MHz]
-emission power: 100 [V/m]
-emission period: 1 [second]
We observed the phenomena "terminal of N2HET is over 16 times slower after TEM-cell test fail"
So we assume there are some problem from OSCILLATOR through CLKDET to PLL.
-16MHz crystal is connected to the device.
-PLL clock is set to 160MHz and provides to GCM.
-After TEM-cell test fail, PLL clock is down to 10MHz because of switching over to HF-LPO as following steps.
1: CLKDET detects a OSCILLATOR fail.
2: OSCIN clock is switchd over to HF-LPO(10MHz).
3: PLL slip is also detected.
4: PLL clock is provided from OSCIN(10MHz) because of bypassing PLL logic.
I'd appreciate if you would send us the some evidence of radiated emissions (TEM cell) test on TMS570.
If not, I'd also appreciate if you would show us an alternate evidence as follows;
-Resemble case and problem solving approach.
(e.g. TEM-cell test fail because of switching over to HF-LPO and how to solve?)
-Credibility of switching over logic of TMS570LS2124.
(e.g. Switching over logic is the same logic of TMS470xx.
We have evidences of TEM-cell test pass.)
