Hello Support,
For MibADC [Dual Port] in TMS570LS0432 device, if I use TRIPLE_READ_FAST_READ algorithm during PBIST Testing of MibADC RAM, is it always guaranteed to FAIL and set FSRF0 Bit at the end of PBIST Test?
Thank you.
Regards
Pashan
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Hello Support,
For MibADC [Dual Port] in TMS570LS0432 device, if I use TRIPLE_READ_FAST_READ algorithm during PBIST Testing of MibADC RAM, is it always guaranteed to FAIL and set FSRF0 Bit at the end of PBIST Test?
Thank you.
Regards
Pashan
Hello Pashan,
The FSRF0 should set the flag to indicate failure. Not sure what is your intent here. If you are intentionally trying to create a failure as a diagnostic to check if the PBIST controller is functioning then you can use the built in pbistSelfCheck() in the sys_selftest.c. This API intentionally uses march13 algorithm on the ROM memory which is supposed to work with only triple_read_fast or triple_read_slow algorithm.
Hello Charles,
You are right that I want to see if FSRF0 bit is STUCK at ZERO or not.
Because the current code in our system didn't use pbistSelfCheck(), so I am asking this question.
Also, then intention was to see if FSRF0 bit gets SET while testing DUAL-PORT RAM.
So, you are saying that TRIPLE_READ_FAST or SLOW for MibADC will always set FSRF0 bit.
Right?
Please confirm.
Thank you.
Regards
Pashan
Hi Pashan,
Yes it should fail. I would rather test it myself before affirmatively saying it will fail. However, I'm currently out of office to test it on the bench. But please let me know if you see the result differently.