in the certifiaction TI 1294973 C001 (show in the pic below),the failure rate in FIT is given, i have two questions about the data form:
1 the first part is the "die failure Rate for TMS570 subsystem common to SIF" , what is the TMS570 subsystem , is it includes the SCR ,ccm-r4f ,stc ,L2RAMW,L2FMC and other modules show in the Technical Reference Manual,or only one special module?
2 in IEC 61508-1 table 3 , the difference for system of sil3 and sil4 is the propability of a dangerous failure per hour. taking care of propability of a dangerous failure per hour ,in certification data form, i only have to care the "failsafe undetect ","faildangerous undetect ",“annunciation undetect” these three parts,because for the parts that can be detected,after the failure be dectected, actions can be done to make safety。am I right?if we just care about the “propability of a dangerous failure per hour”in IEC 61508-1 table 3, the TMS570 can be sil4 capability,am i right?