Hi,
Any recommendations on performance/stress testing tools that we can use for TIVA C microcontrollers?
Thanks,
Rashmi
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Hi,
Any recommendations on performance/stress testing tools that we can use for TIVA C microcontrollers?
Thanks,
Rashmi
An oven test - by itself - seems restricted. Far more useful would be, "Shake/Bake" which provides much more of a, "real world" stress exercise. Often too - the power supplied to the MCU is varied to encompass both the "Max & Min" legal levels - this while, "Shake/Bake" is in play.
Usually "interconnects" - not the MCU - are most prone to failure.
Along w/Robert's "HALT" comes it's sidekick "HASS." Google well defines/outlines. Definitions below.
HALT - Highly Accelerated Life Test
HASS - Highly Accelerated Stress Screen
While not strictly "stress/performance" related - the susceptibility of your device/board to EMI/RFI deserves investigation...
Hi Amit,
Yours is a "good" get - missed by those earlier.
We seized upon "stress" - you locked-on to "non-stress" MCU performance.
Perhaps "both" are important - this is the first occurrence of "serious stress" (here) that I recall....
I've defined HALT (and sidekick) HASS (my post - 2 up) - to avoid poster's (search) demand...
Hi Amit,
Agreed that a good/experienced/"sweat the details" engineer proves a huge asset - yet the value & benefits of a full & proper "Stress Test Procedure" remain - (surely) worth the "Risk-Reward." (i.e. even the "best" engineer is unlikely to catch devices subject to unexpected "infant mortality" - fully outside of the engineer's domain & control...yet well caught/captured by an effective "stress" protocol...)
It appears that the two together, (good engineer & stress procedure) yield "best/brightest" results...
Amit Ashara said:Auto-pilot during take off and landing (not prescribed).
Those (fortunate enough to "return to ground") - after ride in cb1-piloted twin - may not (fully) agree...
Poster appears unimpressed w/effort expended - his behalf...
Hi
I am not aware of the all the different parameters which come under performance testing for MCUs. Some of them can be parameters like speed, power consumption in active mode, standby and low power modes etc
Thank you for your replies
Regards,
Rashmi