• State
  • Locked Locked
  • Replies 4 replies
  • Subscribers 32 subscribers
  • Views 763 views
  • Users 0 members are here
Support feedback
Options
Options
Related

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

[RM57HDK] Cannot connect target in debug mode

honig
Intellectual 745 points
Other Parts Discussed in Thread: HALCOGEN

Dear community,

I can connect the target RM57HDK in the edit mode in CCS, but cannot connect it in the debug mode.

Open the RM57L8xx.ccxml in targetConfigs within from CCS, choose Connection "Texas Instruments XDS100v2 USB Debug Probe" and click "Test Connection", I got "The JTAG DR Integrity scan-test has succeeded.". The log is the following:

[Start: Texas Instruments XDS100v2 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\ADMINI~1\AppData\Local\TEXASI~1\
    CCS\ti\2\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Nov 19 2015'.
The library build time was '00:41:25'.
The library package version is '6.0.83.0'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 6 bits.

The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG IR Integrity scan-test has succeeded.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS100v2 USB Debug Probe_0]

The project can be compiled successfully. However, the target device cannot be connected in the debug mode <F11>.

There is an error message in the Console:

Texas Instruments XDS100v2 USB Debug Probe_0/CortexR5 : Target must be connected before loading program.

The project files are attached  8816.etpwm_ecap_RM57HDK.rar

Note: The project "epwm_adc" in the help document works fine.

Any tip will be appreciated!

  • 0
    Guru 15175 points

    you made the following settings before starting the debug mode? 

    attached file "HL_sys_link" for you to replace your project, HalCoGen has a default file that needs to be replaced by another.

    6330.HL_sys_link.rar

  • 0 in reply to Martin Valencia
    Intellectual 745 points

    Hi Martin,

    Thank you for the timely help!

    The original setting of the project properties was:


    The target device still was not able to be connected, although the settings were changed to what you showed in screen shots. The same error message is shown in the Console.

    Sorry for my ignorance and the silly question. I was able to debug this project even last night. I don't know what project settings were changed. I'll follow the tutorial and create that project once again.

  • 0 in reply to honig
    TI__Mastermind 22375 points

    Honig,

    Using your project, I have no problem to connect and debug your application.

    Here are the steps:

    In CCS Edit contect, expend the Target Configuration as following:

    Right click on RM57L8xx.ccxml and select "Launch Selected configuration"

    The display should switch to CCS Debug context as following:

    Right click on Texas Instruments XDS100v2 USB and select connect target.

    You should be connected to target as:


    Because ECC is enable by default on this device, a specific linker command file is recommended.

    Please have a look at the following wiki page:

    Once your code is compiled and linked than it can be downloaded as following:

    Go to Run->Load->load Program and select the out file in your project.

    After pressing ok, the flash will first be erased and re-programmed with your code.

    Please let me know if this sequence is working. If not, let me know which step is falling.

  • 0 in reply to Jean-Marc Mifsud
    Intellectual 745 points

    Thank you, Jean-Marc!

    I modified the linker file and "Flash Settings" tab in "Debug" as the TI-wiki page suggests. Then I followed every step of your instruction:

    Target configuration -> Launch the selected config. -> Connect Target -> Load the .out file

    The result:

    After that, I selected "etpwm_ecap_RM57HDK" instead of "RM57L8xx.ccxml" for debugging. It seemed to work, except that the red ERROR LED lighted up.

    It could "step over" / "resume". But when it was suspended:

    The blue arrow in "Disassembly" did not move and the green arrow in "HL_sys_main.c" disappeared.