Error -1170 Unable to access the DAP

Feel your pain - and loved your extensive listing of various attempted "fixes." Different probe, uninstalled/reinstalled drivers, reboot PC, multiple boards... think I've got them all.

What about a 2nd (different) PC - ideally pre-loaded & having (past) proved successfully in such operation?

Multiple boards - but are these all from the same batch/build? Perhaps CM installed w/incorrect parts - or a board change has introduced errors?

ALWAYS my small tech firm "keeps" a sacred, "Golden Board" - which helps eliminate any "target board" issues.    Have you such a (past) board which ran successfully under your identical processing/set-up?

Vendor's Eval boards provide another insight/comfort - usually they will connect - until JTAG compromise or other (disaster) visits.   You're silent as to your attempt via (vendor board) test vehicle.

For the future - once you've gotten (something) to connect - carefully scope all signals - this is your "Golden" data signature - and may be compared & referenced when - once again - the delightful, (and xtal clear/retarded) "Error -1170" arrives.

Blasphemy here - but the occurrence of such disconnect is markedly reduced by those employing Segger J-Link.   And "real IDE" (IAR or Keil).   Note that this reporter is uncompensated by Segger, IAR, Keil - but votes (early & often) for their usage...

Hello Barry,

A couple more items to check...

- power supply to the board; assuming you are using the same power supply even if the boards are interchanged.
- USB port used for the JTAG probe to make sure it's still working?
- Device Manager to make sure the JTAG probe is being properly installed with the correct drivers

Do you know if there were any recent updates to your PC (corporate OS fixes pushed out?)
Have you made any updates to your IDE. i.e., installed any updates?

Thanks for the replies.

Still setting up a second installation to test.

I have tried 3 different USB ports, all give same result.

All of these USB ports work fine with other functions UART, ICDI.

I have verified none of the PCBs have a JTAG issue by programming them through mikroprog ICDI interface, all program okay.

All of these boards were previously working.

I hadn't done any updates to CCSV6 between JTAG working then not working and had windows updates waiting to install but they weren't installed.

I have since done reboot of PC which did windows updates and then also made sure all CCSV6 updates were done (Only msp430 updates were installed).

I have uninstalled and reinstalled the USB drivers with no change to the failure.

I have also tested into 3 different power supplies onto my PCBs.

Just tried to do an update again on CCSv6 and got missing dependency

com.ti.ccstudio.installer.win32.feature.group 6.1.2' but it could not be found

Am going to try a CCSV6 reinstall

Thanks for the reply Petrei

I have tried deleting the configuration file and making a new one with no change.
Running the debug Test Connection under CCSV6 show this as failing the tests.

I also tried using Debug JTAG GUI to do tests and all these fail.
Found a post suggesting to do the tests with and without Reset using this program but that did nothing.

Verified that the correct VID and PID are returned by the device.

Went to Blackhawk website and downloaded latest firmware for the XDS100V2 probe.
This too had no impact, still fails.

Went through the suggestions from
processors.wiki.ti.com/.../Debugging_JTAG_Connectivity_Problems

The mikroprog ICDI device works fine but Blackhawk XDS100V2 which was working no longer works, even after clean install of CCSV6 and reinstall of the drivers.

Results of Test Connection are:

[Start: Texas Instruments XDS100v2 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\BARRY~1.AND\AppData\Local\TEXASI~1\
CCS\ti\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Dec 9 2015'.
The library build time was '20:05:50'.
The library package version is '6.0.83.1'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-zero.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-zero.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v2 USB Debug Probe_0]

I have also tried dropping the default fixed 1M JTAG clock to 100kHz

Hi Barry,

So the only thing that seems left that hasn't been explicitly mentioned is the USB cable. Have you tried switching it out with one you know works (assuming this wasn't done when you tried different JTAG probes)?

Thanks for all the responses.

I now have this working again.

Amit your comment number 3 - "JTAG pins swapped" caused me to double check the cable and I found after all the swapping around I had the cable on reverse. XDS100V2 doesn't have pin 1 marked clearly on the 2mm header, I have now marked it very clearly.

This was not the cause of the original failure.

One of my PCBs had a short between two of the JTAG pins, this caused the initial error to occur.

Funny thing is that this then subsequently caused the JTAG to fail on other boards which were previously working.

I suspect this is something due to the xml file as suggested by Petrei

End result is it is now working on all PCBs again, thanks again for all the suggestions.

Hello Barry,

Good to hear that you have cleared the PCB and the subsequent xml change.

Regards
Amit