This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

RM46 test pins

Hello,

My customer is asking below questions.

RM46L430PGE have 3 test pins (FLTP1, FLTP2, TEST).
If these pins are shorted out with neighbor pins, what happen?

[FLTP1/2 pin assignment]
pin#6 N2HET1[11]
pin#7 FLTP1
pin#8 FLTP2
pin#9 GIOA[2]

CaesA: N2HET1[11] shorted with FLTP1
CaseB: FLTP1 shorted with FLTP2
CaseC: FLTP2 shorted with GIOA[2]

[TEST pin assignment]
pin#33 N2HET1[7]
pin#34 TEST
pin#35 N2HET1[9]

CaseA : N2HET1[7] shorted with TEST
CaseB : TEST shorted with N2HET1[9]

Thanks and regards,
Koichiro

  • according to the datasheet of this version of Hercules, it seems to be exclusive pins for the use of Texas Instruments.

    The latter is part of a set of pins that are used for programming the microcontroller!

    Regards

    Martin Valencia

  • Hi Koichiro-san,

      The FLTP1/2 are high impedance pins and should be left un-connected. Shorting N2HET1 and GIO pins to them will add some impedance but most likely has no effect on their functionality. The flash controller needs to be put into flash test modes in order to the FLTP1/2 test pins. 

      The TEST pin when high will put the device in test mode. Therefore, the TEST pin must be tied low at the board even though there is also an internal pulldown on the pin. It depends hwo the N2HET1[7]/[9] are configured. If the N2HET1 pins are configured as inputs then you will read low on these pins input data registers. If these pins are configured as outputs then you have a drive conflict which can result the TEST pin in indeterminable state that may put the device in test mode.

  • Hi Charles,

    Thanks for your answers!

    Regarding TEST pin, if the device is accidentally put in test mode, what exactly happens ?

    The device will be in defined state or the behavior is not predictable ?

    Thanks and regards,
    Koichiro

  • Hi Koichiro-san,

    For many of the test operations, not only the TEST needs to high but also the nTRST needs to be high as well. If both nTRST and TEST are high due to shorts by the nearby pins then the behavior can be unpredictable.