I am reading the Technical Reference Manual of TMS570LS31x / 21x 16/32-Bit RISC Flash Microcontroller.
I am using the safety features of the Flash EEPROM (FEE Data ECC, Flash Wrapper Address ECC).
For injecting a failure to them "5.6.2.4 ECC Malfunction Test Mode 4: DIAGMODE = 4" want to implement.
Please tell us in detail because the specific configuration procedure is not in the manual.