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ECC Malfunction Test Mode 4

I am reading the Technical Reference Manual of TMS570LS31x / 21x 16/32-Bit RISC Flash Microcontroller.

I am using the safety features of the Flash EEPROM (FEE Data ECC, Flash Wrapper Address ECC).
For injecting a failure to them "5.6.2.4 ECC Malfunction Test Mode 4: DIAGMODE = 4" want to implement.

Please tell us in detail because the specific configuration procedure is not in the manual.

  • Haggy,

    Hi the procedure is described in section 5.6.2  Diagnostic Mode.

    The specific details of mode 4 are described in 5.6.2.4.

    I believe that there is a typo error in the heading for 5.6.2.4 and that it should read:

    5.6.2.4 ECC Malfunction Test Mode 2: DIAGMODE = 4

    Does that help? 

    Did you consult the SafeTI Diagnostic Library sources for more detailed information: