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About diagnostic method of EMIF (External Memory Interface) function.

Other Parts Discussed in Thread: TMS570LS3137

I currently use TMS570LS3137.

I am coding a program to diagnose that "External Memory Interface (EMIF)" function is functioning normally.
(Reference document = "Safety Manual for TMS 570 LS 31 x and TMS 570 L 21 x Hercules ARM-Based Safety Critical Microcontrollers User's Guide")

Please tell me about "EMF1" items.

"Safety Manual" contains the following.
>> Information redundancy techniques can be applied via software as an additional runtime diagnostic for this module.

(1) Can the above description of "EMF1" be satisfied by selecting general memory test (eg Walking, Marching) and implementing it?
(2) If it can not be satisfied with (1), what kind of function can be implemented to satisfy this description?

  • Hi,
    Examples of information redundancy is to use checksum as a way of adding desired redundancy. Memory test such as walking and marching would have destroy the content of the external memory. Also the memory test is a diagnostic to check the well being of the external memory. It does not really check the path between the external memory to the CPU.