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RM48L952: RM48L952 : Further information on BIST

Part Number: RM48L952
Other Parts Discussed in Thread: TMS570LS20216, TMS570LS3137

Hello
My customer is asking where they can find a description of the tests performed by the BIST, in particular how much processing time (duration / machine cycles) is required for each test.

We have discovered Apps Report spna128c.pdf but this refers to TMS570 and we are not sure if we should use data provided for the TMS570LS20216 or the TMS570LS3137 - or even some other device.

Could you advise where we can get this information and if there is something similar for the LBIST.

Best Regards

Bob Bacon

  • Hi Bob,

    The PBIST tests that are ran are March13N for RAMs and Triple Read Fast for ROM cells. The cycles taken for execution on each of the tests on each RAM block is given in the datasheet on page 104 Table 6-33. The right 4 columns specify the time in cycles for each of the RAMs on the device.

    For LBIST, the tests are not as defined but essentially focus on ATPG and stuck at fault testing. The timing is broken into intervals such that the entire test could be time sliced and executed over a long period of time during application or all at once at boot time. Details of the intervals can be found in the datasheet on page 73 table 6-9.

    The datasheet can be downloaded from www.ti.com/.../rm57l843.pdf