I use TMS570LS3137.
I have a question about how to implement "Boot Time Software Test of Function Using I / O Loopback".
· Does Analog Loopback recognize using the Digital Loopback function because signals may be output from the pins and other ICs may be damaged?
· In the case of digital loopback, if both pairs are output, it is better to switch the output and try each loopback
· At the time of loop back, is it necessary to wait between writing and reading?
Analog loopback is a recognition that needs to make a loopback circuit.
On this circuit design, it is difficult to make a loopback circuit.
In this case, there is another detection method for the fault that was supposed to be detected by analog loopback?
This is not a true statement. When using analog loop back it is not necessary to make a physical loop back circuit in your design/PCB. The Analog loop back still is done within the boundaries of the device. The difference is that it is outside the boundaries of the digital logic for the module. For clarity, consider the diagram below.
Note in the diagram that the area shown as 'A' is the digital logic part of the module, the area indicated as 'B' is the analog buffers for taking the digital signals out to the real world (still inside the chip), and the area indicated as 'C' is outside the chip or at the pin level of the device. Note the different paths for checking the IO paths. Specifically, note the difference in the boundaries that are crossed and which of the analog buffers are exercised.
> Note that the test of function at boot time N2HET program so IO directions can be changed through loading and reloading different test versions in the HET program memory.
I'm sorry for not knowing this.
It seems my message here is a little confusing because some autocorrect changes that were made. My intent was to state that if you are checking HET IOMM changes, it isn't mandatory that you use the same HET program for testing that you use in your application. The goal of the IOMM loopback test is to insure the correct input and output buffers are connected to the digital logic of the module in use (HET in this case). You could do some simple GIO use of the HET pin to prove that you can toggle the outputs and read the inputs through the HE digital logic/registers.
Boot Time Software Test of Function Using I / O Loopback was recognized by register manipulation, is it using HET Code?
I am not certain what you are asking here but I believe you are driving at a question of how to implement the loopback at the register level? So each module will have the loop back capability as defined in the TRM. In some cases there is no specific loop back functionality defined and is inherent in the design of the IO buffers. For example, to test a GPIO functionally, you need only to set the direction to output, drive the output high and low and read the input in the input register to see the corresponding changes from the input buffers. For other IP, it might be necessary to accommodate system level tests to check the paths and functions. It really is a situation where you need to understand the operation of the module on the chip and how it fits within the system application to decide the best way to assure proper operation and balance that with overall system performance needs.
