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TMS570LS3137: About the self-test functions generated by HalCoGen

Part Number: TMS570LS3137
Other Parts Discussed in Thread: HALCOGEN

Hi TI Experts,

We have a customer using TMS570LS3137 designing a functional safety product, now customer brought up several questions:

1. Power-up self-test

When using HalCoGen, if we enable SAFETY INIT, it generates a sys_selftest.c file, does that mean users can simply call the functions generated and no more extra self-test is required?

2. Cyclic self-test

If we enable ESM interrupt in HalCoGen, then when error occurs, there will be accordingly interrupts. If user also take good care about the register contents reading back,  what other procedures is needed to implement as cyclic self-test.

3. How to validate the self-test functions generated by HalCoGen as well as those provided by MCU hardware. Will the MCU TUV certificate be enough to prove?

Please give us some guiding, thanks.

(From my understanding, I think customer could use the FMEDA spreadsheet to set up the working model, and use the diagnostic coverage provided to calculate the FIT rate to see if it can match their safety goal. Is my understanding right?)