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Soft errors and latch-ups?

Martin Unwin
Prodigy 10 points

 

Is there information on the susceptibility of the SRAM and registers to cosmic rays, neutrons, etc.? Presumably the ECC provides excellent protection against any such soft errors - but do you know the sensitivity given your current manufacturing process?

Also is there any information on liability to latch-up?

Thanks,

Martin.

 

  • 0
    TI__Mastermind 23000 points

    Hello Martin,

    As part of our design for functional safety, we perform extensive testing of susceptibility to alpha and neutron particles for both SRAM and registers.  At this time we can only provide the details under Non Disclosure Agreement (NDA), generally as part of our quantitative safety analysis reports (i.e. FMEDA).  Please contact your local TI field sales office to set up an NDA and we will gladly share the information with you.

    Regarding latch-up, this is typically considered a systematic rather than random failure mode for functional safety analysis.  A properly designed system does not exhibit latchup; as such we cannot quantify a probability to latchup.  We do follow extensive internal guidelines of best practices to make our devices less sensitive to ESD events, and our device qualification processes test device ESD resistance to industry norms. 

    Best Regards,

    Karl