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TMS570LC4357: Clock test mode and External Clock Prescaler (ECP) functionality

Christopher TRITANT
Expert 1080 points
Part Number: TMS570LC4357

Hello,

We are using the TMS570LC4357 and we need more information about Clock test mode and external clock prescaler (ECP) functionality ?

Our understanding is that the Clock test mode and the ECP are two functionalities a bit different but with the same pin ECLK1.

- Clock test Mode is enabled via CLK_TEST_EN bit of CLKTEST register at 0x5 and monitored clock is seen on ECLK1 pin thanks to ECPCLKFUN bit of SYSPC1 register at 0x1.

- We want to use ECP functionality (frequency divided on ECLK1 pin) but we do want to use the clock test mode.

- Do we need to enable Clock test mode (via CLK_TEST_EN bit of CLKTEST register) and configure CLKTEST register (SEL_ECP_PIN bit for example) if we want to use only the monitoring and prescaler (ECP) functionality to monitor for example VCLK or OSCIN (configured via ECPCNTL register) or only ECLK1 pin in funcional mode thanks to ECPCLKFUN bit of SYSPC1 register at 0x1 is sufficient ?

Best regards,

Christopher

  • 0
    TI__Mastermind 21425 points
    Hello Christopher,
    You could use ECP functionality without enabling Clock Test Mode.
    When ECLK1 pin is in Functional mode and Clock Test Mode is disabled (CLK_TEST_EN != 5 ) you can monitor only VCLK and OSCIN (depends on ECPSSEL bit).
    Enabling Clock Test Mode allows monitoring of many other sources, depending on SEL_ECP_PIN bits.

    Best regards,
    MIro