Hello,
We are using the TMS570LC4357 and we need more information about Clock test mode and external clock prescaler (ECP) functionality ?
Our understanding is that the ECLK1 functionality can be put in GIO mode or functional mode but not deactivated whereas the Clock test Mode can be disabled.
- Clock test Mode is disabled via CLK_TEST_EN bit of CLKTEST register different of 0xA.
- ECP functionality is enabled via ECPCLKFUN bit of SYSPC1 register at 0x1.
Since ECLK1 functionality can work without Clock test Mode is enabled, can we deactivate the ECLK1 functionality ?
Best regards,
Christopher
