Other Parts Discussed in Thread: HALCOGEN
Hello,
I implemented a self test for the HF_LPO using the DCC (Dual Clock Compare) unit. So I selected my Reference clock to be the "OSCIN" and used the Values (Seeds, Valid0) generated by HALCoGen. The problem is, while running this test on several MCUs the Tolerance Window (Valid0Seed) varies too large. For one of the MCUs it is about 5.1% and for the other it is about 8.6% and so on.
Could someone please help me solving this issue, why the same test (DCC) on different MCUs from the same product family needs different Tolerance Windows?
Best Regards