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CCS/TMS570LC4357: PBIST test of the memory: Can I wait for certain time before checking for memory errors?

Xiangguang feng
Intellectual 510 points

Part Number: TMS570LC4357

Tool/software: Code Composer Studio

Hi TI Team Member,

I am trying to do a test to put my TMS570LCxx  MCU in a certain environment for a period of time, and see if the flash/RAM data gets corrupted during this period of time (hours or days).   For this purpose,  will I be able to use PBIST self-testing.   I don't quite understand what PBIST does for self-testing.   Does it write specific data to the memory and read it immediately, or can it be a user-specified time between the writing and reading?  Thanks a lot.

Xiangguang Feng

  • 0
    TI__Guru**** 200146 points

    Hello Xiangguang,

    TMS570 microcontrollers are implemented with programmable built-in self test (PBIST) architecture. The PBIST architecture provides a memory BIST engine for varying levels of coverage across many embedded memory instances.

    The PBIST is to test the integrity of the embedded RAMs and ROMs. It is destructive to the data stored in the target RAM. After test completes, the application code has to re-initialize the target RAM. The PBIST supports several test algorithms which are stored in PBIST ROM, but we recommend the March13N algorithm for application testing of SRAM. March13N is the baseline test algorithm for SRAM testing, and it provides highest overall coverage. The basic operation of the march is to initialize the memory array to a know pattern, then march a different pattern through the memory.

    The patterns are defined in PBIST ROM. You can not use your own data patterns.