Hi,
I have questions from my customer about FEE(Flash EEPROM Emulation) function.
Q1) Do we have data self-test function for memory contents inside EEPROM?
Customer expects something they can execute the test to detect broken memory bits at production line.
Q2) Suppose a broken bit is detected by the test, is there software function to hide(invalidate) the broken bit (or line) to prevent using the broken bit in application?
Thanks and regards,
Koichiro Tashiro