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RM48L952: CSP-tests for ADC

user5256995
Intellectual 295 points

Part Number: RM48L952

Hi,

Our ADC tests fail for several channels that are not used in our setup. Channel 10, 11 and 15 are expecting ADC_PIN_OPEN, ADC_PIN_SHORTED_TO_ADVREF_LOW, and ADC_PIN_SHORTED_TO_ADVREF_HIGH respectively in the test output. However, they hold value ADC_PIN_GOOD since these channels are not used. 

Can we claim that these tests are not relevant if the channels are not used, or is it important to use these channels for some reason? 

  • 0
    TI__Guru**** 200256 points

    The ADC selftest works well for external input voltages in the range between ADREFLO and ADREFHI. But it does not work well with external input levels very close to ADREFHI or ADREFLO. I don't suggest to use ADC selftest on a floating ADC pin.

    Please refer to this thread:

  • 0 in reply to QJ Wang
    Intellectual 295 points

    Thanks! However, I don't fully understand how to apply that answer to our problem, so I need to ask some clarifying questions.

    As I understand it, we should not change the ADC channels that are predefined in the test suite (10, 11, and 15 for ADC_PIN_SHORTED_TO_ADVREF_HIGH, ADC_PIN_OPEN, and ADC_PIN_SHORTED_TO_ADVREF_HIGH tests), right? 

    Are ADC selftests supposed to work out-of-the-box, or is it something that we need to do with either the hardware or our setup to make them pass? Currently, I am running the supplied ADC test suite from the CSP package on a standard RM48 development board. Our ADC1 group events are all disabled, ADC2 is disabled, and ADC1 pins 4, 6, and 14 - 23 are disabled.

    Regards

    /Avenir

  • 0 in reply to user5256995
    TI__Mastermind 49120 points

    Hi Avenir,

    Tests for ADC included within the CSP rely on external input stimulus for proper operation. These are documented in the test case xls files for the ADCs. These tests do need to be modified as per your system setup.