This thread has been locked.
If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.
When perform the TI provided sdl_ex_flash_ecc_test.
Technical Reference Manual documents . When ECC test mode is enabled, the CPU cannot read the data from Flash and instead the CPU gets data from the ECC test mode registers (FDATAH_TEST/FDATAL_TEST). This is because ECC test mode registers (FDATAH_TEST, FDATAL_TEST, FECC_TEST) are multiplexed with data from the Flash.
From my understanding that the real flash address shall also have the same data 0xFEDCBA0987654321ULL, but in the debug, it shows not.
How to understand the ECC test mode registers (FDATAH_TEST, FDATAL_TEST, FECC_TEST) are multiplexed with data from the Flash.
Hello,
(Updated answer)
You should not expect to see valid data written to the ECC test mode registers in the debug window by accessing the flash address. This behavior is undefined, and the TRM specifies not to do this. To confirm data written to the ECC logic for test purposes, use CPU code to perform your verification, or read the test mode registers.
Best regards,
Ibukun
Yes, I understand the TRM's introduction of how to do it.
But I cannot understand TI's multiplexed theory.(ECC test mode registers are multiplexed with data from the Flash.)
Is there detail clarification document?
No, we do not publish details of internal Flash logic beyond the device technical reference manual.
Best regards,
Ibukun