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TMS320F280025: TMS320F280025

Part Number: TMS320F280025
Other Parts Discussed in Thread: TMS320F28379D,

Hi Team ,
               I am using XDS100V2 debugger of TMS320F28379D Launchpad to program TMS320F280025.I removed the isolators that isolates the Debugger with the MCU of the Launchpad. But I am unable to program the target MCU for some reason. For your reference, I have attached a snapshot of my connections. I have checked my connections and reduced the TCLK frequency upto 10KHZ. But couldn't fix the issue. It  shows unable to access device registers in all cases. 

  • Hi Rajaram,

    I would like to validate that hardware is connected properly first. Can you provide your connections to the target device, either diagram or picture to help me understand the setup. Do note that F280025 does not support the TRSTn signal so that signal does not need to be routed to the target (first white wire from the bottom). Also, looks like you are not utilizing SCI for debugging communication, is this intended?

    Regards,

    Peter

  • Hi Peter,
    My Hardware connections are proper. I tried without routing TRSTn signal to the target, but still facing the same issue. Also we don't need SCI signals for JTAG right ?  Below image shows the pinout of my JTAG debugger.

    And in target (TMS320F280025 - 48 Pin) I am connecting pins 28 to 31 with the respective signals. Below is the Pinout diagram of my Target.

  • Hi Rajaram,

    Correct, SCI is not required to be connected, but it often is especially for our EVMs. 

    Could you provide your ccxml file that you have configured for this? Please allow me to examine this to ensure proper configurations

    In the mean time, have you referred to our JTAG Debug guide? This is helpful in providing additional steps to verify your JTAG setup: https://www.ti.com/lit/an/spracf0b/spracf0b.pdf 

    Regards,

    Peter

  • Hi Peter,

    1)  I read the JTAG Debug guide. It says we need 5 Pins (TDI, TDO, TCK, TMS, TRSTn). But, since you said TMS320F280025 does not support TRSTn signal, now my JTAG debugger has four pins.(TDI,TDO,TCK,TMS). Is this correct ?



    2) My PC is able to recognize the debugger. I am checking this in "Device Manager --> Ports". Does this mean that there is no problem with my debugger ?
    I have attached the image for your reference.




    3) Also, I have attached the configuration file and the error message.

    Config File :

    <?xml version="1.0" encoding="UTF-8" standalone="no"?>
    <configurations XML_version="1.2" id="configurations_0">

    <configuration XML_version="1.2" id="Texas Instruments XDS100v2 USB Debug Probe_0">
    <instance XML_version="1.2" desc="Texas Instruments XDS100v2 USB Debug Probe_0" href="connections/TIXDS100v2_Connection.xml" id="Texas Instruments XDS100v2 USB Debug Probe_0" xml="TIXDS100v2_Connection.xml" xmlpath="connections"/>
    <connection XML_version="1.2" id="Texas Instruments XDS100v2 USB Debug Probe_0">
    <instance XML_version="1.2" href="drivers/tixds100v2icepick_c.xml" id="drivers" xml="tixds100v2icepick_c.xml" xmlpath="drivers"/>
    <instance XML_version="1.2" href="drivers/tixds100v2c28x.xml" id="drivers" xml="tixds100v2c28x.xml" xmlpath="drivers"/>
    <instance XML_version="1.2" href="drivers/tixds510ajsm.xml" id="drivers" xml="tixds510ajsm.xml" xmlpath="drivers"/>
    <platform XML_version="1.2" id="platform_0">
    <instance XML_version="1.2" desc="TMS320F280025_0" href="devices/f280025.xml" id="TMS320F280025_0" xml="f280025.xml" xmlpath="devices"/>
    </platform>
    </connection>
    </configuration>
    </configurations>

    Below is the error message : 

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\vinod\AppData\Local\TEXASI~1\CCS\
    ccs1250\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100/110/510 class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Sep 6 2023'.
    The library build time was '09:57:39'.
    The library package version is '9.13.0.00201'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 64 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-zero.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-zero.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 1, skipped: 0, failed: 1
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]

  • Hi Rajaram,

    Please see below note from the datasheet regarding the TRSTn not being present on the device.

    New image looks correct. Would be helpful if you can provide the ccxml file itself.

    Regards,
    Peter

  • Hi Peter,

    I couldn't upload the .ccxml file directly. Please find the Compressed Config file below.
    TMS320F280025C.rar

  • Rajaram,

    If you have scan test fail then it means the signal integrity for JTAG signal  is not proper. You need to double check that. You can try reducing the TCK clk frq in ccxml file to see if that help.

    Regards,

    Vivek Singh