• State Resolved
  • Locked Locked
  • Replies 1 reply
  • Subscribers 82 subscribers
  • Views 228 views
  • Users 0 members are here
Support feedback
Options
Options
Related

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

Original question:

TMS320F28388D: Diagnostic Example code is not working on core 2

TMS320F28388D: BIST Support to CM Core

Vikram Tathe
Prodigy 175 points

Part Number: TMS320F28388D
Other Parts Discussed in Thread: C2000WARE

Tool/software:

Hello and Team,

We are using the TMS320F28388D microcontroller from the C2000 series and have already implemented Built-In Self-Test (BIST) features on the C28x CPU1 and CPU2.

We have referred the example code from "C2000Ware_5_02_00_00\libraries\diagnostic\f2838x\examples\test_application" and added support for the following tests in our application:

  • STA_HWBIST_MICRO
  • STA_HWBIST_FULL
  • STA_MARCH
  • STA_MARCH_COPY

Now, we want to add the Built-In Self-Test (BIST) support specifically for these tests to the Connectivity Manager (CM) core as well.

Is it possible to execute the same tests on the CM core? If yes, can we use the same library for implementation?

Thanks & Regards,

Vikram Tathe

  • +1
    TI__Guru 54845 points

    The HWBIST module only supports the testing of the C28 CPUs on this device. The March test is written in C28 assembly, so it would need to be rewritten for the Arm core if you wanted to perform a similar test from the CM. We do not have an SDL for the CM. The CM is not part of the device safety assessment and should be treated as QM.

    Whitney