TMS320F28P650DK: ADC Performance Question and Issue

Part Number: TMS320F28P650DK

TI ADC Test.xlsx 

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We are bserving a nonlinear offset (or delay) issue with the TI TMS320F28P65 DSP ControlCard. In our test setup, we supply a sample voltage to the ADC channel (configured with 16bit precision, external 2.5V precision reference and sample window of 80 SYSCLK counts).  Measuring Vref input and ADC sample signal input look okay. However, the ADC reading does not match the expected value based on:  (ADC_Count = ADC_volt * 65536/2.5). W
e are seeing a noticeable offset/delta in the ADC results.

Our test data is complied within the attached file. Can we have a joint call to go over the situation?

Thank you.

  • Hi Jwalant,

    How did you generate the voltage to be given to the microcontroller ADC pin? Can you also get the error if you give the voltage form the DAC of the microcontroller.

    Also is there anything in the circuit other than the sensing?

    Thanks,
    Harisyam