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Original question:
Tool/software: Code Composer Studio
Hello,
I have a board that provides 5.010V and 3.310V for the F28379D board. IJP1, JP2, JP3 and JP6 are disconnected. The problem is that I cannot run my program from the CCS7 with the board connected to the external power supply, although it should work as explained in section 6.2 of the user guide. The probe doesnt connect and give the error:
Error connecting to the target:
(Error -2131 @ 0x0)
Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).
(Emulation package 7.0.100.0)
If I connect JP1, JP2 and JP3, and use only USB instead of the external power supply the debugger works perfectly.
I also tried the test connection provided by the CCS7 and seems that JTAG communication fails.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0xFFFFFFC1.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted - 83.6 percent.
The JTAG IR Integrity scan-test has failed.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 64 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x0B99C02F.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Scan tests: 2, skipped: 0, failed: 2
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 49: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFE2.
Test 3 Word 50: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 51: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 52: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 53: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 3
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 4
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 5
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 6
Some of the values were corrupted - 54.7 percent.
The JTAG DR Integrity scan-test has failed.
