F28M36P63C2: F28M36P63C2 Radiation analysis

Part Number: F28M36P63C2

Hi,

We are using a  F28M36P63C2 microcontroller and we would like to calculate the Single Event Upset (SEU) rate in error per hour and the Multiple Bit Upset (MBU) rate in error per hour. I see that you can provide us a failure rate in FIT for SEU and for MBU : could you give it to us with maximal values and with average values ?

Here is the useful data :

-          We consider proton and neutron effect

-          Maximum altitude is 43000 feet, with an average altitude around 37000 feet

-          Maximum latitude is 90°, with an average latitude of 45°

-          Flight time : maximum is 20 hours with 5 hours on average,

-          Maximum temperature is 105°C for components and 85°C for ambient temperature, an average value would be 45°C

-          VDDIOmin=3,135V

-          VDD12min=1.176V 

-          VDD18min=1.764V

Best regards,