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Original question:

컴파일러 / TMDSHVMTRPFCKIT :TMDSHVMTRPFCKIT It doesn't work.

Compiler/TMDSHVMTRPFCKIT: continuous error..

KIM TAEOH
Prodigy 50 points
Part Number: TMDSHVMTRPFCKIT


Tool/software: TI C/C++ Compiler

Hello, I asked similar questions last time, but I couldn't solve them.

i used F2806x ISO controlCARD..

First, I will attach the situation that I am in now.

Even if you keep trying, it doesn't work because of an error.

I have been struggling for 2 months since I bought this product.

What is the problem?

  • 0 in reply to KIM TAEOH
    TI__Guru** 116350 points

    Can you connect the kit using CCS? And what error will CCS report when you click "Test Connection" in Target Configuration File?

    As replied to the post you mentioned, you should use the isolation USB JTAG on controlCard, not the one on High voltage kit as the figure you posted, and please make sure the switches on both controlCard and High voltage kit are correct as well.

  • 0 in reply to Yanming Luo
    Prodigy 50 points


    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v1 USB Debug Probe_0]

    I checked this message when I connected the ccs. What is the problem?

  • 0 in reply to KIM TAEOH
    TI__Guru** 116350 points

    You might have a look at below two links that should help you to know to connect the XDS100 emulator.

    http://processors.wiki.ti.com/index.php/Debugging_JTAG_Connectivity_Problems

    http://processors.wiki.ti.com/index.php/XDS100#Troubleshooting