I've found a case where a peripheral (the RF1A module, if it matters) has an interrupt where I need to detect both the positive transition and the negative transition. The signal will generally be low, and it's safe for my state machine if the initial configuration is to detect low-to-high transitions. The duration when the signal is high may be extremely short, though it should be at least 8 MCLK ticks.
The digital IO module documentation suggests that inverting the IES bit within the interrupt call "may" do the right thing. I.e., if I entered on a low-to-high transition and at the instant I update IES the IN value is already low, the documentation says IFG "may be set". I'd be more comfortable if it said "will be set".
In practice and absent chip errata, is it safe to assume that it will be set?
If not, is there an alternative recommended pattern for robust detection of both edges of an interrupt?