MSP430FR5969-SP: Single-event Effects test bootloader and firmware

Andy Woodruff

Part Number: MSP430FR5969-SP
Other Parts Discussed in Thread: MSP430FR5969

Tool/software:

Hi, I'm working on a radiation-hardened application and I was wondering if the custom bootloader and possibly firmware described in SLAK026 "Single-event Effects Test Report of the MSP430FR5969-SP" can be made available. They seem to be a critical component of error recovery for the most common kinds of radiation events, and it would be nice to have a proven reference implementation. Additionally, is there any other TI published guidance on writing application code with radiation tolerance in mind?

Thanks,
Andy

over 1 year ago

0 Pengfei Xie over 1 year ago

TI__Genius 13765 points

Hi Andy,

I'm not sure whether you could find what you want in the MSP430FR5969 SDK: MSP430FR5969.

And there are some other materials for this topic:

MSP430FR5969-SP Radiation-Hardened Mixed-Signal Microcontroller TID Rad Report

MSP430FR5969-SP Neutron Displacement Damage Characterization Radiation Report

0 David Schultz over 1 year ago

Guru 26465 points

One thing I didn't see mentioned in that report was the FRAM ECC system. It did talk about some code that could repair code defects but provided zero detail. There were apparently memory upsets.

I would expect that since every FRAM access is read/write with an ECC check that scrubbing every, or at least every used, FRAM location periodically would be a good thing. Reading them often enough to catch correctable failures before they progress to uncorrectable.

Logging of failures corrected and having a mechanism to report them might be nice.

0 Pengfei Xie over 1 year ago in reply to David Schultz

TI__Genius 13765 points

Hi David,

Thanks for your kindly advice as for FRAM ECC.

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MSP430FR5969-SP: Single-event Effects test bootloader and firmware