Hi,
Is there any code available for MSP430 to do external memory tests.
I looked here, i do not see any.
http://www.ti.com/mcu/docs/mcusplash.tsp?contentId=128826#CE
Thanks.
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Hi,
Is there any code available for MSP430 to do external memory tests.
I looked here, i do not see any.
http://www.ti.com/mcu/docs/mcusplash.tsp?contentId=128826#CE
Thanks.
'external memory' is just a meaningless name for a possible application-driven peripheral and has no special meaning for the MSP.
The MSP does not have an external memory/address bus, so test code for an attached external memory is not different for test code for any other possible fancy peripheral you attach to it through GPIO, SPI, I2C or UART.
Hi,
The customer is well aware of how external memory is treated on MSP430. Question was "is there sample test code" ?
Also, how about on chip RAM, is there sample test code for that? I realise that such code is simple to write, however the customer wants to know if there is a samle he can leverege to get his project up and running fast.
thanks.
And my answer was: since external memory is just another applicaiton-controlled external component as any other thinkable device you attach to the MSP by any means you can think of, there is as much sample code for it as for any other thinkable external device.DerekG said:The customer is well aware of how external memory is treated on MSP430. Question was "is there sample test code" ?
For on-chip-ram, there is no RAM test I know of. Due to the small amount (relatively large cell structure size), failure that isn't already detected at production time isn't likely. Also, static rams aren't that likely to fail as dynamic rams are. The chance of a random fluke by a radioactive ionisation is by some magnitudes more likely than a failure of the MSPs internal ram that could be detected by a ram test.
However, if you need a ram test for some reason, determine what you want to have tested, and test it. Perhaps it is enough to protect some ram-based but not too often changed data by a CRC. Or you run a few test pattern across the ram before you start your application.
Also, to create an effective algorithm for a ram test you need information about the physical construciton of the ram. Organization in rows and columns or physical orientation on the die. Else you'll be testing things that cannot fail by design and missing to test things that could.
There are many ways to test your ram, depending on what you want to test (or against what you want to protect your application). As many as there are psychologic/sanity tests for humans.
Norman answered the query.
For your information the customer has the choice of using TI devices or one of the competitor devices. He is entitled to ask TI queries on any matter relating to TI devices if he is going to design them in, however meaningless they may seem to you, right?
Given that the product is a medical device the customer is entitled to test his on chip or off chip RAM as part of a start up diagnostic, if he chooses
When i file queries, i am looking for answrs not opinions.
Have a nice day.
The customer always has the choice. Oly slaves don't have a choice.DerekG said:For your information the customer has the choice of using TI devices or one of the competitor devices.
Then file them to the technical support or to Google. Not to an engineers-to-engineers forum, even if it is run by the manufacturer.DerekG said:When i file queries, i am looking for answrs not opinions.
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