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memory testing for FRAM

Other Parts Discussed in Thread: MSP430F5438A

Hi friends,

I want to perform memory test in FRAM MB85RS64 from fujitsu. 

I am using MSP430F5438A and SPI communication. 

I am new to embedded field. I don't know how to do this. 

I read some algorithm is there to test memory. But I am not find exactly.

Please give a way to do this. I am waiting for all your guidance.

Thanks in advance.

Regards,

Keerthi G. 

  • Keerthi,

    What kind of tests are you wanting to attempt? FRAM endurance/data retention? Or just an overall test of writing/reading the data?

    For the latter option, you just need to learn the protocol for writing the FRAM and write a specific value to a block of memory. Then perform the read operation to ensure that you read the same data that you wrote.

    If you can be more specific about what you want to test, it may help me steer you to what you need to do.

  • Hi Tyler Witt, 

    Thanks for ur valuable reply...  

    I want to test FRAM working well like all memory locations working fine.

    No need to test endurance/ data retention. 

    I read marching 0/1 algorithm. 

    I need some algorithm like that very simple. No need of complex algorithm. 

     

    just an overall test of writing/reading the data?

    I need this one only. Is it enough for memory testing by read and write operation alone?

    Regards,

    Keerthi G

     

  • Keerthi,

    To test that the memory locations are good, writing and reading (then confirming) the data should be sufficient.

    You could also integrate a software CRC or perform a checksum of some sort.

    The easiest option would be to write a known pattern into the FRAM, then read it out and see that the pattern shows in the read data.

  • In the past, memory tests were done by

    1. Writing a 0x5555 to every memory location, then reading back to see if 0x5555 could be read.

    2. Writing a 0xAAAA to every memory location, then reading back to see if 0xAAAA could be read.

    3. Writing a unique value to each memory location (like its address), then reading back to see if the unique pattern could be read.

    The first two tests would check for stuck bits or adjacent bit problems.

    The 3rd test would check to see that each memory location could be accessed.

    Hopefully that helps. I do not know if there is such code already written - you may have to write the code.

  •  Hi Tyler Witt and Todd Anderson, 

    Thanks for yours valuable reply. 

    I will write code and test it. 

     

    You could also integrate a software CRC or perform a checksum of some sort.

    Tyler Witt ,, I can't understand this. Can you please elaborate it?

     

    Regards,

    Keerthi G

     

     

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