Hi,
We are working on MSP430 and GSM based automotive application. In our current design we are facing following issue.
- Crystal getting failed randomly during GSM activity with network (SIM registration, data transfer etc).
We are not able to find out the root cause for this issue. We are suspecting this might be due to Poor Power supply Isolation, EMI or EMC. Kindly suggest us how to go ahead with this issue.
Solutions we have tried:
1) We have introduced Snap Ferrites in the Power Cable from Vehicle Battery - No result
2) Ferrite beds between the GSM Ground and uC Power supply GND - No Result
3) Restart the uC when EXT OSC Failed - No Result
4) Changed the basic XTAL to AEQ-100 Spec XTAL - Little better results. Failure rate is reduced.
We doubt the following reasons for failing,
1) Crystal failure due to EMI/EMC
2) uC PC Corruption due to EMI/EMC
3) Failure due to Power supply surges due to sudden GSM bursts
Observations:
1) OSCFAULT Flag is set during SIM Registration
2) We dont have oscilloscope, we tried in PC based oscilloscope (20-20KHz) for XTAL (16 MHz) pins. We are able to see some burst noises during GSM Activity.
Kindly help us for the following:
1) Suggest some reference power supply designs with MSP430 and GSM for Automotive applications. (We are refining this with new design)
2) Suggest us how to isolate the GSM and Controller part.
Thanks in Advance,
Nithin James.