Greetings,
I am posting this question against the MSP430FR5969 but its applicability is general to all TI silicon devices.
I am requesting a confirmation of the calculation below. In this example we wish to determine the number of failures predicted using the FIT data published by TI for 19,000 MSP430FR5969 devices operated continuously for a period of 30 years.
Practical example:
(1) Go to www.ti.com/.../estimator.tsp.
(2) Type in MSP430FR5969.
(3) Select MSP430FR59691IRGZR.
(4) Download the spreadsheet (MSP430FR5969).
(5) Open the spreadsheet (and trust TI, ignoring any warnings from Microsoft).
(6) Read FIT (=5.6) from the spreadsheet.
(7) Apply a simple ratio calculation (below).
(5.6 devices)/(1E9 devices*hours) = (N_failed devices)/((30*365*24 hours)*(19000 devices))
N_failed = (5.6)*(262.8E3)*(19E3)/(1E9)
N_failed = 27.96
--- Background / References ---
• www.ti.com/.../reliability_testing.page
• www.ti.com/.../estimator.tsp
• Mathematical formulae: www.ti.com/.../reliability_terminology.page
• 3162.MTBF-MTTF-MTTR-FIT Explanations.pdf
• www.ti.com/.../reliability_testing.page
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Thank you in advance for your response.
BR,
Kevin
