Customer is migrating from MSP430FR6922 RevA to Rev B. Rev B includes improvements to TEST pin noise immunity but does not fix the PORT28 errata according to the latest MSP430FR6922 Device Erratasheet (Rev. F). Customer is considering a 10K external pulldown to reduce TEST pin noise immunity.
Questions:
1. What value resistor would you recommend on the TEST pin that would still allow JTAG functionality? MSP430 JTAG wiki suggests 4.7K.
2. Confirm JTAG would be disabled after 100 usec following a transient event as noted in the MSP430™ Programming With the JTAG Interface (Rev. X)
Anything else you would suggest?
Thanks,
Mark