Other Parts Discussed in Thread: ENERGYTRACE,
Hello.
I have a question.
I would like to know if there are data measured in a situation similar to the setting like the following.
When I use the 4MHz HFXT crystal and set MCLK at 1MHz, measurement result was 369 uA on average.
I measured MSP430FR5969 launchpad using EnergyTrace.
Register settings are as follows:
int main(void)
{
WDTCTL = WDTPW | WDTHOLD;
P1DIR = 0xFF;
P1OUT = 0;
P2DIR = 0xFF;
P2OUT = 0;
P3DIR = 0xFF;
P3OUT = 0;
//P3SEL1 |= BIT4;
P4DIR = 0xFF;
P4OUT = 0;
PJOUT = 0;
PJSEL0 |= BIT6 + BIT7;
PJDIR = 0xFFFF;
PM5CTL0 &= ~LOCKLPM5;
CSCTL0_H = CSKEY >> 8;
CSCTL2 = SELA__VLOCLK + SELM__HFXTCLK + SELS__HFXTCLK;
CSCTL3 = DIVM__4 + DIVS__1;
CSCTL4 = 0x0409;
do
{
CSCTL5 &= ~(LFXTOFFG | HFXTOFFG);
SFRIFG1 &= ~OFIFG;
}while (SFRIFG1&OFIFG);
CSCTL0_H = 0;
while (1);
}
Is my measured current value valid?
Regards,
Uchida-k