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MSP430FR5739: FRAM Data Retention calculation clarification

Kannan Sockalingam
Intellectual 1925 points
Part Number: MSP430FR5739


Hi team,

I am working with a customer on this device. We reviewed SLAA526 and the datasheet already. Table 5.36 shows 10 years at 85C. What is the confidence level of the 10 years at 85C? It is 60% or 90% or something else?

  • 0
    TI__Mastermind 49692 points

    Hello Kannan,

    Thanks for using E2E. Table 5.36 shows that data retention will last for a minimum of 10 years for all devices operating in the recommended ranges. The data retention is characterized through the use of accelerated tests based on the Arrhenius theory and equation. This theory allows the testing of any device under accelerated environments for short periods and predicts the behavior under normal conditions for longer periods. Depending on the acceleration factor (AF), a back calculation using the Arrhenius equation for any desired temperature leads to fairly accurate data-retention times. For more details about this process, please refer to the Understanding MSP430 Flash Data Retention app note (can be applied to FRAM devices too).

    Regarding the confidence level (CL), this relates to calculating the statistical failure rate at the device level (not just data retention). For these calculations, the CL is chosen to be 60% or 90% which directly contributes to the Failure-In-Time (FIT) rate.

    DPPM/FIT/MTBF estimator

    I hope this helps.

    Regards,

    James

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