UC1625-SP: Susceptibility to SEE effects, request for HDR test reports (if available)

Hi Nick,

I need to reach out to the expert as before for more information to back up the above statement. Please allow me some time this week to figure this out to ask the right person and get you the info you're looking for. 

Thanks,
Aaron

Hi Nick,

We are still looking to find the right information for this, I will provide you an update next week. 

Thanks,
Aaron

Hi Nick,

We are still awaiting feedback from the space product experts, we are escalating this to prioritize your request. We'll let you know once they are able to confirm if other SEE or HDR testing has been performed. 

Thanks,
Aaron

Hi Nick,

Please remain patient as we continue to try to seek the info for your request. 

Thanks,
Aaron

Hi Nick,

We have HDR testing for UC1625-SP in this document here: https://www.ti.com/seclit/rr/snaa259

We do not have SEL data for this device. Are you interested in just SEL data or looking for additional characterization data?

Thanks,
Aaron 

Hi Aaron,

Thanks for continuing to look into this. I am not able to follow the link that you provided--it returns a 404 on my end--but I am able to find a document at this address (which is nearly the same) with the same number (SNAA259):

www.ti.com/.../snaa259.pdf

(So I assume this is the same document.)

However, the dose rate specified in this document is 0.01 rads/sec (see top of page 3 in the PDF), which according to MIL-STD-883 constitutes an ELDRS test--this is defined in section

>  3.6.4 Condition D. For condition D, for bipolar or BiCMOS linear or mixed-signal devices only, the parts shall be irradiated at ≤10 mrad(Si)/s.

High dose rate testing would be condition A, specified as:

>  3.6.1 Condition A. For condition A (standard condition) the dose rate shall be between 50 and 300 rad(Si)/s [0.5 and 3 Gy(Si)/s] 60Co 2/ The dose rates may be different for each radiation dose level in a series; however, the dose rate shall not vary by more than ±10 percent during each irradiation.

I.e., this report (as I read it) is an ELDRS report and not an HDR report.

Aaron Barrera said:

We do not have SEL data for this device. Are you interested in just SEL data or looking for additional characterization data?

For our documentation purposes, it is not strictly necessary for SEE testing to have been performed if TI can point to specific literature (e.g., a test report for another device fabricated in this same process) that justifies the statement that the dielectrically isolated bipolar process is SEL immune.

Thanks,

Nick