Hello,
We are using the BQ78350-R1 chip in out BMS to monitor our battery pack status. However, we often encountered the Data Flash Wearout (DFW) permanent fail. The PF can be cancelled through a BMS reset, that is disconnect and reconnect the power lines. We suppose that this is due to excessive write on the data flash, probably triggered by some subroutine we still have to correctly identify. Do you have some infos on how to correctly handle the data flash and possibly avoiding too many write access to it?
If needed we can share parts of the proprietary source code which handle the TI chip.
Regards,
Ferdinando Gasparini,
Battery Test Engineer
Stiga s.p.a.