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UC2907: UC2907

Joey Oweis
Prodigy 30 points
Part Number: UC2907
Other Parts Discussed in Thread: UC3907

Hi,

           I am test engineer looking to test a UC2907 TI Datasheet SLUS165C. Can a test circuit be provided for a typical application which includes this device?

Thanks,

Joey

  • 0
    TI__Expert 8550 points

    Hello Joey,

    We have the UCC39002EVM which supports the UC2907. This is an orderable evaluation module that showcases the features of the UC2907 on testable hardware. The UC3907 and the UC2907 have the same pin to pin functionality with different operating temperature ranges.

    Regards,

    Jonathan Wong

  • 0 in reply to Jonathan Wong
    Prodigy 30 points

    Thank you. I am needing more of a schematic containing the UC2907 (showing all 16 pins) and any external circuitry such that ATE resources can directly attach to each pin (if necessary). I am wanting to measure each parameter of the datasheet. Is there anything like this available?

  • 0 in reply to Joey Oweis
    TI__Genius 15416 points

    Hi Joey,

    I found this ATE schematic for UC2907A. I hope this helps.

    SCH (9).PDF

  • 0 in reply to Manuel Alva Hernandez
    Prodigy 30 points

    Thank you. This does help but I was wondering if a simpler ATE schematic existed. One with fewer tester resources and relays? This could be for the UC2907,UC1907, or UC3907.

  • 0 in reply to Joey Oweis
    TI__Genius 11350 points

    Hi Joey, Manuel is out of the office today. I'm sorry, but we don't have a simpler schematic. It seems you have the information to create one in whatever format you need.

    Regards,

    Ray

  • 0 in reply to Ray DiCecco
    Prodigy 30 points

    Thanks Ray. I want to understand how to test this device a little better and was hoping a simplified schematic would help.This device is more complex than I have dealt with in the past. Is it possible to get a set of test conditions (including relay position) for each test parameter?

  • 0 in reply to Joey Oweis
    TI__Mastermind 40120 points

    Hello Joey, 

    The UC2907 datasheet provides 2 pages of electrical characteristics (EC) that constitute the parameters that are 100% automatically tested by TI (unless noted otherwise).  In the center of the EC table, the salient test conditions are also provided for each parameter (where applicable) although these may not be all of the conditions set up for each test.  

    I'm sorry, but TI does not normally release the ATE programs and test-board schematics for our devices to the public.  Since you are lucky to have been able to obtain a copy of the test board, it should be possible to isolate each sub-circuit of the controller and reverse-engineer the test methods that would need to be used to generate the test data listed in the EC table for each sub-circuit.  If you analyze each sub-circuit independently, you should find that it is not as complex as it appears when taken all together. 

    Regards,
    Ulrich